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- Verification of Charge Transfer in Metal-Insulator-Oxide Semiconductor Diodes via Defect Engineering of Insulator
Verification of Charge Transfer in Metal-Insulator-Oxide Semiconductor Diodes via Defect Engineering of Insulator
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Filamentary Resistive Switching and Capacitance-Voltage Characteristics of the a-IGZO/TiO2 Memory. - Abstract - Europe PMC
Verification of Charge Transfer in Metal-Insulator-Oxide Semiconductor Diodes via Defect Engineering of Insulator
Materials, Free Full-Text
Materials, Free Full-Text
High-performance oxide thin-film diode and its conduction mechanism based on ALD-assisted interface engineering - Journal of Materials Chemistry C (RSC Publishing) DOI:10.1039/D2TC03751C
Ion-gating analysis on conduction mechanisms in oxide semiconductors - ScienceDirect
Vertical Transport Control of Electrical Charge Carriers in Insulator/Oxide Semiconductor Hetero-structure
Vertical Transport Control of Electrical Charge Carriers in Insulator/Oxide Semiconductor Hetero-structure. - Abstract - Europe PMC
Effects of Unusual Gate Current on the Electrical Properties of Oxide Thin-Film Transistors
Materials, Free Full-Text
PDF) Verification of Charge Transfer in Metal-Insulator-Oxide Semiconductor Diodes via Defect Engineering of Insulator
Nanoscale All-Oxide-Heterostructured Bio-inspired Optoresponsive Nociceptor
Defect engineering in ZnIn2X4 (X=S, Se, Te) semiconductors for improved photocatalysis - ScienceDirect
On Practical Charge Injection at the Metal/Organic Semiconductor Interface
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